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Description
Ba₀.₇₅Sr₀.₂₅TiO₃ thin films doped with ruthenium (0.0% and 0.5%) were successfully fabricated on p-type Si (100) substrates using the Chemical Solution Deposition (CSD) method assisted by spin coating at a rotation speed of 3000 rpm for 30 seconds, with the coating process repeated three times. A precursor solution with a concentration of 0.5 M was employed and aged for seven months prior to the deposition process. The prepared thin films were subsequently characterized by measuring their thickness and investigating their optical and crystal structural properties. Whilst film thickness may be influenced by aging, non – monotonic pattern was visible for increasing Ruthenium concentration. Fresh undoped film showed a thickness of ~54.512 nm whereas fresh undoped film showed a thickness of 30.238 nm. Additionally, the aged undoped film exhibited a direct optical bandgap of ~3.57 eV, higher than the non – aged undoped film at ~3,09 eV. Altered bandgap suggests that precursor aging may modify the optical properties of films. XRD results suggests that the films are cubic with a lattice parameter of a = 3.830 Å.
